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  1. 歡迎光臨~蘇州矽鈦特電子科技有限公司
    服務熱線
    全國客服熱線:

    0512-65218453

    探針臺

    • 分析探針臺XB-200
    • 分析探針臺XD-100
    分析探針臺XB-200

    分析探針臺XB-200

    • 名稱:分析探針臺Analytical Probe Station
    • 型號:XB-200
    • 在線訂購

    XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配體視顯微鏡


    XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配金相顯微鏡

    Specifications
    Vacuum Chuck 8" 
    Huged-Knob Chuck Stage 
    Chuck stage 8"×8" Travel 
    Chuck Theta 0°~30°
    Chuck Up/Down 4mm Adjustable
    Microscope Stage 2"×2" Travel
    660mmW x 660mmD x 700mmH With Microscope
    Weight 80kg with microscope

    Accessories
    Microscope Magnification:1000X
    Hot Chuck:200/300/400℃
    Special Chuck Design for RF
    Platen Up/Down 6mm Adjustable/Coarse Adjustment/Lever-Driven
    Platen Up/Down 25mm Adjustable/Fine Adjustment/Hand wheel-Driven
    CCD and Screen
    Micropositioner
    Tip Holder
    Shielding Box
    Vibration Free Table

    The Probe Station XB-200 is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system provides best known methods for I-V/C-V measurements.
    Designed for upgradability and extendable with multiple options. The Probe Station XB-200 can be easily reconfigured to meet your future project requirements, such as RF testing and high voltage testing .

    導航欄目

    聯系我們

    電話:0512-65218453

    羅先生:13915537793

    張先生:18912645295

    地址: 蘇州工業園區宏業路158號聯發工業園15號廠房

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