分析探針臺XB-200

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配體視顯微鏡

XB-200或者XB-300或者XD-100或者XD-150或者XD-200或者XD-300配金相顯微鏡

Specifications
Vacuum Chuck 8" 
Huged-Knob Chuck Stage 
Chuck stage 8"×8" Travel 
Chuck Theta 0°~30°
Chuck Up/Down 4mm Adjustable
Microscope Stage 2"×2" Travel
660mmW x 660mmD x 700mmH With Microscope
Weight 80kg with microscope

Accessories
Microscope Magnification：1000X
Hot Chuck：200/300/400℃
Special Chuck Design for RF
Platen Up/Down 6mm Adjustable/Coarse Adjustment/Lever-Driven
Platen Up/Down 25mm Adjustable/Fine Adjustment/Hand wheel-Driven
CCD and Screen
Micropositioner
Tip Holder
Shielding Box
Vibration Free Table

The Probe Station XB-200 is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system provides best known methods for I-V/C-V measurements.
Designed for upgradability and extendable with multiple options. The Probe Station XB-200 can be easily reconfigured to meet your future project requirements, such as RF testing and high voltage testing .